x-ray spectrometer

基本解釋X[射]線譜計(jì)

網(wǎng)絡(luò)釋義

1)x-ray spectrometer,X[射]線譜計(jì)2)X-ray spectrum,X射線譜3)X-rayspectrum,X-射線譜4)X-ray diffraction pattern computer,X射線衍射圖譜計(jì)算機(jī)5)double crystal X-ray spectrometer,雙晶體X射線光譜計(jì)6)nondispersive X-ray spectrometer,非色散X射線光譜計(jì)

用法和例句

This paper mostly discusses a kind of new type electric refrigeration semiconductor detector that measures X-ray, and its application in X-ray spectrum analysis.

介紹了一種測(cè)量X射線的Si-PIN電制冷半導(dǎo)體探測(cè)器,以及它在X射線譜分析中的應(yīng)用。

We investigate the X-ray spectrum of two-temperature accretion disk and consider the effects of thermal electron and positron pair production upon the structure and spectrum of accretion disk.

這種盤的光子輻射譜是冪律的與一些天體 X射線譜的觀測(cè)相似。

The resulti show that, for stronger X-ray spectrum (15 keV Planck spectrum), Compton scattercan cause the depositional energy and the peak pressur of X-ray shock wave to decrease, in LY-12 aluminium, the disagreement aE(x) /E(x) range from 9 % to 22 %, △Pm(x) /Pm(x) is about 12 %.

計(jì)算結(jié)果表明,對(duì)較硬的X射線譜(15heVPlanck譜),康普頓散射造成能量沉積與熱擊波峰壓明顯下降,在LY-12鋁中,能量沉積的相對(duì)差△E(X)/E(X)可達(dá)9%~22%,熱擊波峰壓的相對(duì)差△Pm(X)/Pm(X)約為12%。

energy dispersive X-ray spectrometer

能量擴(kuò)散X射線譜

X-Ray spectroscopy studies on Ni_(100-x)P_x alloys

Ni_(100-x)P_x合金的X射線譜學(xué)研究

nondiffraction X-ray spectrometer

非衍射x射線光譜儀

X-ray diffraction pattern computer

X射線衍射圖譜計(jì)算機(jī)

X-ray fluorescent emission spectrometer

X射線熒光發(fā)射光譜儀

x ray fluorescence spectroscopy

x 射線熒光光譜分析

fluorescent X - ray spectroscopy

熒光x-射線光譜分析

four crystal X-ray spectrometer

四晶體x射線光譜儀

X-ray absorption spectrometer

X射線吸收式光譜儀

x ray spectrometry

x 射線光譜分析法

X-ray energy dispersive spectrometr

x-射線能量分散譜儀

X-ray photo-electron spectrometer (XPS)

X射線光電子能譜儀

double crystal X-ray spectrometer

雙晶體x射線光譜計(jì)

nondispersive X-ray spectrometer

非色散x射線光譜計(jì)

X-ray wave length dispersive spectrometer

X射線波長(zhǎng)色散譜儀

multiple crystal X-ray spectrometer

多晶體x射線光譜儀

X-ray photo electron spectroscopy (XPS)

X射線光電子能譜法

External Total Reflection Angle X-ray Microanalysis of Thin Film;

薄膜外全反射角X射線能譜分析研究

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