Change of macroscopic stress in ZnSe devices during the processing was determined by X-ray diffraction analysis.
用X射線衍射分析技術(shù)測(cè)定晶體器件在加工過(guò)程中宏觀應(yīng)力的變化。
Talc powder in flour was determined by X-ray diffraction analysis(XRD) after isolation of flour with carbon tetrachloride or cineration at high temperature from 500℃ to 750℃.
通過(guò)四氯化碳分離或高溫灰化,X射線衍射分析測(cè)定面粉中摻入的滑石粉。
X-ray diffraction analysis and differenti al thermal analysis(DTA)have been used to study the structure of Pd-20W alloy.
對(duì)Pd - 2 0W合金進(jìn)行X射線衍射分析和差熱分析 ,結(jié)果表明 :Pd - 2 0W合金是面心立方固溶體 ,合金的晶格點(diǎn)陣參數(shù)和晶粒大小隨著溫度的變化而變化 ,在溫度緩慢下降至 75 0℃時(shí)出現(xiàn)了超結(jié)構(gòu)轉(zhuǎn)變。
The XRD analysis of sample shown that the crystal-grain dimension, the diffraction peak intensity and the crystal lattice constant were affected by annealing time.
對(duì)以銦、錫氯化物為前驅(qū)物,采用溶膠-凝膠法制備的摻錫氧化銦薄膜(ITO膜)樣品進(jìn)行了X射線衍射分析,研究了熱處理時(shí)間對(duì)ITO膜的影響,結(jié)果表明熱處理時(shí)間影響ITO膜晶粒的大小、衍射峰的相對(duì)強(qiáng)度和晶格常數(shù);熱處理時(shí)間為15min時(shí),ITO膜晶粒較大,衍射峰擇優(yōu)取向不明顯,晶格畸變較小,此時(shí)ITO膜的方阻最小。
The XRD analysis of sample showed that the diffraction peak intensity,the crystal lattice constant and crystal-grain dimension were affected by annealing temperature.
采用溶膠-凝膠法以銦、錫氯化物為前驅(qū)物制備不同熱處理溫度下的ITO膜,對(duì)制備的ITO膜樣品進(jìn)行X射線衍射分析。
X-ray diffraction (XRD) program was improved.
同時(shí),簡(jiǎn)要介紹運(yùn)用X射線衍射分析判斷新相生成并對(duì)其進(jìn)行表征,探討制備條件對(duì)組成結(jié)構(gòu)的影響,推測(cè)反應(yīng)機(jī)理及解決生產(chǎn)中的問(wèn)題,為制備合格材料提供依據(jù)。
Multi-anvil apparatus and X-ray diffraction technology were used to investigate the phase transformation of synthesized NaAlSiO_(4) over a temperature range from 1200 to 2000 ℃ and a pressure range from 22 to 25 GPa.
采用多頂砧靜態(tài)高溫高壓實(shí)驗(yàn)裝置和X射線衍射分析方法研究了合成霞石NaAlSiO4在壓力為22～25GPa,溫度為1200～2000℃條件下的相變及其產(chǎn)物的晶體學(xué)特征,結(jié)合前人研究成果探討了NaAlSiO4的高溫高壓相變過(guò)程和CaFe2O4型NaAlSiO4的穩(wěn)定性及其地質(zhì)意義。
X-ray diffraction,including Bragg\'s equation in crystallography,the Fourier transform of helical structures,and Wilkins\' experimental determination of the double helix are discussed.
簡(jiǎn)述了薛定諤對(duì)基因物質(zhì)的預(yù)言和德?tīng)柌紖慰说热岁P(guān)于DNA是遺傳物質(zhì)的確定;介紹了DNA結(jié)構(gòu)的X射線衍射分析,其中包括在X射線晶體學(xué)中的布拉格方程,螺旋結(jié)構(gòu)的傅里葉變換,威爾金斯對(duì)雙螺旋結(jié)構(gòu)的實(shí)驗(yàn)驗(yàn)證;介紹了分子模型方法,其中包括鍵角與鍵長(zhǎng),雜化軌道理論,碳四面體型軌道的量子力學(xué)計(jì)算,在分子的空間構(gòu)型中氫鍵的作用。
With X ray diffraction analysis, phases of complicated aluminum electrolytes with additives which included CaF 2, MgF 2 and LiF et al were studied, and the effect of cooling rate on the formation of phase was also investigated.
利用X射線衍射分析法研究了復(fù)雜鋁電解質(zhì)的物相組成 ,同時(shí)研究了冷卻條件對(duì)電解質(zhì)物相的影響·結(jié)果表明氟化鈣、氟化鋰、氟化鎂等添加劑在酸性電解質(zhì)中的物相要比在堿性電解質(zhì)中的復(fù)雜 ;氧化鋁的存在形式與氧化鋁的濃度有關(guān) ;氟化鈣的物相在不同冷卻條件下具有不同的形式·這些結(jié)果的獲得對(duì)工業(yè)鋁電解質(zhì)分子比的分析具有重要意
This paper introduces X Ray Diffraction Analysis, the most widely used method in identifying soil minerals, including the principles, testing procedures, diffractometer, sample preparation and the diagram for mineral identification.
介紹了鑒定土中的礦物成分最常用的 X射線衍射分析方法 ,包括分析原理、試驗(yàn)程序、儀器設(shè)備、試樣制備和結(jié)果整理 。
Through X ray diffraction(XRD) analysis of high rank Carboniferous period coal located in the northern foreland basin of Dabie Orogenic Belt in the eastern China,the evolution character of XRD parameters of high rank coals and the effecting factors are studied.
通過(guò)對(duì)大別造山帶前陸盆地石炭紀(jì)含煤巖系高煤級(jí)煤的X射線衍射分析 ,探討了高煤級(jí)煤基本結(jié)構(gòu)單元的演化特征及其影響因素。
The nucleation and crystallization of Li2O-Al2O3-SiO2 glasses which has P2O5、TiO2、ZnF2 as nuclear doses independently are investigated by the differential thermal analysis(DTA),X-ray diffraction(XRD) and the scanning electron microscopy(SEM).
采用差熱分析(DTA)、X-射線衍射分析(XRD)和掃描電鏡(SEM)等分析手段研究了P2O5、TiO2、ZnF2作為晶核劑對(duì)Li2O-Al2O3-SiO2(LAS)系統(tǒng)微晶玻璃形核和晶化的影響。
Based on the analysis of the chemical composition,X-ray diffraction(XRD),infrared spectroscopy(IR),differential thermal analysis(DTA) and scanning electron microscopy(SEM),the characteristics of Handan bentonite were studied.
采用化學(xué)成分分析、X-射線衍射分析、紅外光譜、差熱分析和掃描電鏡等分析方法,研究了邯鄲膨潤(rùn)土的特征。
The Analysis of Nanostructured Co/Fe/Cu Granular Alloys by X-ray Diffraction;
納米Co/Fe/Cu合金的X射線衍射分析
Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray Diffraction
J75不銹鋼淬火應(yīng)力的X射線衍射分析
X-ray diffraction analysis of Pt film prepared by magnetron sputtering method
磁控濺射Pt薄膜織構(gòu)的X射線衍射分析
Expression, Crystallization, and X-ray Diffraction Analysis of Polyhydroxyalkanoate Granule Associated Proteins;
PHA顆粒結(jié)合蛋白的表達(dá)、結(jié)晶與X射線衍射分析
Study on Molten Structure of Ni_3Al Alloy by High Temperature X-ray Diffraction
Ni_3Al合金熔體結(jié)構(gòu)的高溫X射線衍射分析
Application of XRD Technique in Aluminum Electrolysis Industry
X射線衍射分析技術(shù)在電解鋁工業(yè)中的應(yīng)用
X-ray Diffractive analysis of Crystal Structure ?
X-射線衍射晶體分析
Application of X-ray Diffraction Technology in Material Analysis
X射線衍射技術(shù)在材料分析中的應(yīng)用
The microstructure of the film was characterized by X ray diffraction, transmission electron microscopy, and selected area diffraction.
用X射線衍射儀、射電鏡及其選區(qū)衍射來(lái)分析薄膜的微結(jié)構(gòu)。
Combined Analysis of Urinary Stones by X-ray Photoelectron Spectroscopy and X-ray Powder Diffraction
泌尿系結(jié)石的X射線光電子能譜和X射線衍射聯(lián)合分析
Study on the identification of standard and false Ejiao by XRF and PXRD
真?zhèn)伟⒛z的X射線熒光分析及X射線衍射鑒別研究
x ray photoemission diffraction
x射線光電發(fā)射衍射
" Metal materials--Quantitative phase analysis--""Value K""method of X-ray diffraction"
GB/T5225-1985金屬材料定量相分析X射線衍射K值法
Analysis on Crystalline Structure of Cellulose Fiber from Cotton-Straw Bast by X-ray Diffraction Method
X射線衍射法分析棉稈皮纖維結(jié)晶結(jié)構(gòu)
Analysis of Tritium-Aging Effects of LaNi_5 Alloys Using XRD
利用X射線衍射技術(shù)分析LaNi_5氚老化效應(yīng)
single crystal X-ray diffractometer
單晶體x射線衍射儀
nondiffraction X-ray spectrometer
非衍射x射線光譜儀
X-ray diffraction pattern computer
X射線衍射圖譜計(jì)算機(jī)